Facilities

Our major facilities:




 
 
Atomic Force Microscopy (AFM)
Piezoresponse Force Microscopy (PFM)
      - Vector PFM (Vertical and Lateral PFM)
      - SS-PFM (Spectroscopy switching PFM)
Magnetic Force Microscopy (MFM)
Conductive Atomic Force Microscopy (c-AFM, sample bias)
Conductive Atomic Force Microscopy (c-AFM, tip bias)
Kelvin Probe Force Microscopy (KPFM)
Electrochemical Strain Microscopy (ESM)
Electrpstatic Force Microscopy (EFM)
Electrochemical Atomic Force Microscopy (EC-AFM)
Contact Resonance Atomic Force Microscopy (CR-AFM) or Atomic Force Accoustic Microscopy (AFAM)
AM-FM Module
Dual Frequency Resonance Tracking (DFRT)
Band Excitation (BE) Image and Analysis for PFM and AFAM
Heating stage
Fluid cell
Environmental control
High voltage (HV) module for PFM and ESM
Lateral Force
Nanolithography.
 
  
 
Electrochamical Workstation (CompactStat.e, Ivium Technologies, The Netherlands), including following functions:
 
Potentiostat
Galvanostat
Impedance Analyzer
Electrometer
Battery Testing
 
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